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  4. Efficient Polycrystalline Single-Cation Perovskite Light-Emitting Diodes by Simultaneous Intracrystal and Interfacial Defect Passivation
 
research article

Efficient Polycrystalline Single-Cation Perovskite Light-Emitting Diodes by Simultaneous Intracrystal and Interfacial Defect Passivation

Kim, Hobeom
•
Heo, Jung Min
•
Wolf, Christoph
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January 8, 2025
Small

Polycrystalline perovskite light-emitting diodes (PeLEDs) have shown great promise with high efficiency and easy processability. However, PeLEDs using single-cation polycrystalline perovskite emitters have demonstrated low efficiency due to defects within the grains and at the interfaces between the perovskite layer and the charge injection contact. Thus, simultaneous defect engineering of perovskites to suppress exciton loss within the grains and at the interfaces is crucial for achieving high efficiency in PeLEDs. Here, 1,8-octanedithiol which is a strong nucleophile, is used to increase the luminescence efficiency of a single-cation perovskite by suppressing non-radiative recombination within the grains of their polycrystalline emitter film as well as at their interface with an anode. The dithiol additive performs a multifunctional role in defect passivation, spatial confinement of excitons, and prevention of exciton quenching at the interface between the perovskite layer and the underlying hole-injection layer. Photoluminescence studies demonstrate that incorporating the dithiol additive significantly enhances the charge carrier dynamics in perovskites, resulting in an external quantum efficiency (EQE) of up to 23.46% even in a simplified PeLED that does not use a hole-injection layer. This represents the highest level of EQE achieved among devices utilizing polycrystalline single-cation perovskites.

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Type
research article
DOI
10.1002/smll.202405272
Scopus ID

2-s2.0-85204805357

PubMed ID

39319479

Author(s)
Kim, Hobeom

Seoul National University

Heo, Jung Min

Seoul National University

Wolf, Christoph

Seoul National University

Kim, Young Hoon

Seoul National University

Lee, Seong Chul

PEROLED Co. Ltd.

Yoon, Eojin

Seoul National University

Lee, Geon Hui

Pohang University of Science and Technology

Jang, Kyung Yeon

Seoul National University

Park, Junmo

Gwangju Institute of Science and Technology

Kim, Joo Sung

Seoul National University

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Date Issued

2025-01-08

Published in
Small
Volume

21

Issue

1

Article Number

2405272

Subjects

defect passivation

•

interface engineering

•

MAPbBr 3

•

perovskite light-emitting diodes

•

thiol additive

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CIME-GE  
LCOM  
FunderFunding(s)Grant NumberGrant URL

National Research Foundation of Korea

Ministry of Science, ICT & Future Planning

NRF‐2016R1A3B1908431

European Union's Horizon 2020 research and innovation programme

763989

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Available on Infoscience
January 24, 2025
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/243699
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