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research article

Room temperature ferromagnetism down to 10 nanometer Ni–Fe–Mo alloy films

Banerjee, Mitali  
•
Majumdar, A.K.
•
Rai, S.
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October 31, 2013
Thin Solid Films

Magnetic behavior of a few pulsed laser deposited soft ferromagnetic thin films of Ni–Fe–Mo alloys of different thickness on sapphire single crystals is interpreted on the basis of their structural characteristics. Highly textured thin films have high void density due to island-like growth. X-ray reflectivity (XRR) of the thin films indicate that instead of a uniform density there are effectively three layers with density gradient across the thickness, which is further supported by atomic force microscopy and cross-sectional scanning electron microscopy. Rutherford backscattering spectroscopy and energy dispersive spectrum measurements reveal that the composition in the films is not too far from that of the bulk target with a trend of enhanced Fe yield in the films. The structural disorder strongly affected the magnetic property of the films resulting in much higher values of the Curie temperature TC and coercive field HC than those of the bulk targets. Bifurcations of low-field zero-field-cooled and field-cooled magnetization reflect the disorder-induced anisotropy in the thin films. The spin wave stiffness constants D are higher than their bulk counterparts which are supportive of the enhanced Fe yield in the films. The saturation magnetization, M calculated from measurements in field transverse to the films strongly supports the thickness found from XRR. Finally, even the 10 nm thin films have sizable M and HC and TC > 300 K, making them good candidates for magnetic applications. Overall, the magnetic behavior and the structural characteristics have reasonably complemented each other.

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Type
research article
DOI
10.1016/j.tsf.2013.07.070
Author(s)
Banerjee, Mitali  

EPFL

Majumdar, A.K.
Rai, S.
Tiwari, Pragya
Lodha, G.S.
Banerjee, A.
Nair, K.G.M.
Sarkar, Jayanta
Choudhary, R.J.
Phase, D.M.
Date Issued

2013-10-31

Publisher

Elsevier BV

Published in
Thin Solid Films
Volume

545

Start page

385

End page

390

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
LQP  
FunderFunding(s)Grant NumberGrant URL

University Grants Commission

Available on Infoscience
August 27, 2024
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/240879
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