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  4. Selective oxidation and selective etching of allnn layers for manufacturing group iii nitride semiconductor devices
 
patent

Selective oxidation and selective etching of allnn layers for manufacturing group iii nitride semiconductor devices

Buehlmann, Hans-joerg
•
Dorsaz, Julien
•
Carlin, Jean-francois
2007

A method for including an oxide region in a layered structure being grown epitaxially on a substrate, comprising the steps of epitaxially forming a Group III-nitride precursor layer, and selectively oxidizing the precursor layer, thereby forming the oxide region.

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Type
patent
EPO Family ID

36602113

Author(s)
Buehlmann, Hans-joerg
Dorsaz, Julien
Carlin, Jean-francois
Note

Alternative title(s) : (fr) Oxydation selective et gravure selective de couches de allnn pour fabrication de dispositifs semi-conducteurs au nitrure du groupe iii

TTO classification

TTO:6.0532

EPFL units
AVP-R-TTO  
IdentifierCountry codeKind codeDate issued

WO2006066962

WO

A3

2007-03-29

WO2006066962

WO

A2

2006-06-29

Available on Infoscience
June 13, 2017
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/138349
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