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Stanisavljevic, M., Schmid, A., & Leblebici, Y. (2006). Fault-Tolerance of Robust Feed-Forward Architecture Using Single-Ended and Differential Deep-Submicron Circuits Under Massive Defect Density. International Joint Conference on Neural Networks (IJCNN), 2771–2778. https://doi.org/10.1109/IJCNN.2006.247183

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