Fault-Tolerance of Robust Feed-Forward Architecture Using Single-Ended and Differential Deep-Submicron Circuits Under Massive Defect Density
An assessment of the fault-tolerance properties of single-ended and differential signaling is shown in the context of a high defect density environment, using a robust error-absorbing circuit architecture. A software tool based on Monte-Carlo simulations is used for the reliability analysis of the examined logic families. A benefit of the differential circuit over standard single-ended is shown in case of complex systems. Moreover, analysis of reliability of different circuits and discussion on the optimal granularity of redundant blocks was made.
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Stanisavljevic, M., Schmid, A., & Leblebici, Y. (2006). Fault-Tolerance of Robust Feed-Forward Architecture Using Single-Ended and Differential Deep-Submicron Circuits Under Massive Defect Density. International Joint Conference on Neural Networks (IJCNN), 2771–2778. https://doi.org/10.1109/IJCNN.2006.247183
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