Piezoelectric properties of rhombohedral Pb(Zr, Ti)O-3 thin films with (100), (111), and "random" crystallographic orientation
The longitudinal d(33) piezoelectric coefficient was studied in rhombohedral Pb(Zr0.6Ti0.4)O-3 thin films with (111), (100), and "random" orientation. The largest d(33) was found in (100)-oriented films and the smallest along the polarization direction in (111)-oriented films. These results are in a good qualitative agreement with recent theoretical predictions [Du, Zheng, Belegundu, and Uchino, Appl. Phys. Lett. 72, 2421 (1998)]. The field dependence of d(33) was also investigated as a function of crystallographic orientation of the films. It was found that (100)-oriented films with the highest piezoelectric coefficient exhibit the weakest nonlinearity. Observed variation in the piezoelectric nonlinearity with film orientation can be fully explained by taking into account domain-wall contributions, which are dependent on film orientation. (C) 2000 American Institute of Physics. [S0003-6951(00)02912-0].
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Taylor, D. V., & Damjanovic, D. (2000). Piezoelectric properties of rhombohedral Pb(Zr, Ti)O-3 thin films with (100), (111), and “random” crystallographic orientation. Applied Physics Letters, 76(12), 1615–1617. https://doi.org/10.1063/1.126113
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WOS:000085857100043
2000
76
12
1615
1617
Taylor, Dv Ecole Polytech Fed Lausanne, Swiss Fed Inst Technol, Dept Mat, Ceram Lab, CH-1015 Lausanne, Switzerland Ecole Polytech Fed Lausanne, Swiss Fed Inst Technol, Dept Mat, Ceram Lab, CH-1015 Lausanne, Switzerland
293MU
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