On-Chip Self-Calibrating Communication Techniques Robust to Electrical Parameter Variations

• Published in: IEEE Design and Test of Computers, vol. 21, num. 6, p. 524-35
• Publication date: 2004

Keywords: Robust Design

Reference

• EPFL-ARTICLE-53134
• doi:10.1109/MDT.2004.96
• View record in Web of Science

Record created on 2005-08-08, modified on 2012-03-28