Drift in silicon integrated sensors and circuits due to thermo-mechanical stresses

Manic, Dragan

doi:10.5075/epfl-thesis-2213

doctoral thesis

Drift in silicon integrated sensors and circuits due to thermo-mechanical stresses

Manic, Dragan

2000

Cite this item

Manic, D. (2000). Drift in silicon integrated sensors and circuits due to thermo-mechanical stresses (Publication No. 2213) [PhD thesis, EPFL; Supervised by R. S. Popovic]. https://doi.org/10.5075/epfl-thesis-2213

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