Near-field polarization measurements based on two arbitrary, orthogonal optical field components
Sfez, Tristan; Descrovi, E.; Yu, Libo; Brunazzo, D.; Quaglio, M.; Dominici, L.; Nakagawa, W.; Michelotti, F.; Giorgis, F.; Martin, O. J. F.; Herzig, Hans Peter
2010

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Abstract

Using a multi-heterodyne scanning near-field optical microscope, we detect two arbitrary, orthogonal components of the near field. A numerical treatment of the experimental data allows the retrieval of the transverse and longitudinal components of the modes propagating in a waveguide for Bloch surface waves.

Details

Title Near-field polarization measurements based on two arbitrary, orthogonal optical field components
Author(s) Sfez, Tristan ; Descrovi, E. ; Yu, Libo ; Brunazzo, D. ; Quaglio, M. ; Dominici, L. ; Nakagawa, W. ; Michelotti, F. ; Giorgis, F. ; Martin, O. J. F. ; Herzig, Hans Peter
Conference EOS Topical Meeting on Advanced Imaging Techniques (AIT) , Engelberg, Switzerland, June 29 – July 2, 2010
Date 2010
ISBN 978-3-00-030503-0
Keywords
Laboratories NAM
OPT
Record Appears in Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > NAM - Nanophotonics and Metrology Laboratory
Scientific production and competences > STI - School of Engineering > STI Archives > OPT - Optics and Photonics Technology Laboratory
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date 2011-01-06

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