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research article
Near-edge x-ray absorption fine-structure investigation of graphene
We report the near-edge x-ray absorption fine-structure (NEXAFS) spectrum of a single layer of graphite (graphene) obtained by micromechanical cleavage of highly ordered pyrolytic graphite on a SiO2 substrate. We utilized a photoemission electron microscope to separately study single-, double-, and few-layers graphene samples. In single- layer graphene we observe a splitting of the pi* resonance and a clear signature of the predicted interlayer state. The NEXAFS data illustrate the rapid evolution of the electronic structure with the increased number of layers.
Type
research article
Web of Science ID
WOS:000258538600054
Authors
Publication date
2008
Publisher
Published in
Volume
101
Article Number
066806
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
April 1, 2010
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