Quantitative analysis of electron-beam-induced current profiles across p-n junctions in GaAs/Al0.4Ga0.6As heterostructures
We propose a method for the quantitative evaluation of electron-beam-induced current profiles measured in normal-collector geometry across p-n junctions in GaAs/Al0.4Ga0.6As heterostructures. We obtain a theoretical expression, valid for all distances from the junction, and which takes into account the spatial extension of the electron-hole pairs generation. From the comparison of calculated with experimental profiles, we evaluate the minority carrier diffusion length and to some extent the surface recombination velocity. (C) 1996 American Institute of Physics.
WOS:A1996UJ08400044
1996
79
9
6987
6994
Bonard, JM, ECOLE POLYTECH FED LAUSANNE,INST MICRO & OPTOELECTR,CH-1015 LAUSANNE,SWITZERLAND.
ISI Document Delivery No.: UJ084
Cited Reference Count: 29
Cited References:
AKAMATSU B, 1989, J MICROSC SPECTROSC, V14, A12
AUKERMANN LW, 1967, J APPL PHYS, V38, P685
BEGGAH Y, 1994, MAT SCI ENG B-SOLID, V24, P101
BERZ F, 1976, SOLID ST ELECTRON, V19, P437
BONARD JM, IN PRESS J APPL PHYS
BRESSE JF, 1982, SCANNING ELECTRON MI, V4, P1487
DONOLATO C, 1982, SOLID ST ELECTRON, V25, P1077
DONOLATO C, 1994, J APPL PHYS, V76, P959
HACKETT WH, 1972, J APPL PHYS, V43, P1649
HACKETT WH, 1972, J APPL PHYS, V43, P2857
HOLT DB, 1989, SEM MICROCHARACTERIZ
JASTRZEBSKI L, 1975, APPL PHYS LETT, V27, P537
KONNIKOV SG, 1988, SOV PHYS SEMICOND, V21, P1229
LEAMY HJ, 1982, J APPL PHYS, V53, R51
LUKE KL, 1985, J APPL PHYS, V57, P1978
LUKE KL, 1994, J APPL PHYS, V75, P1623
OELGART G, 1981, PHYS STATUS SOLIDI A, V66, P283
ONG VKS, 1994, SOLID STATE ELECTRON, V37, P1
ORTON JW, 1990, ELECT CHARACTERIZATI
PERANSIN JM, 1986, PHYS STATUS SOLIDI A, V94, P713
REIMER L, 1985, SCANNING ELECTRON MI, CH7
SIEBER B, 1994, MAT SCI ENG B-SOLID, V24, P35
VANROOSBROECK W, 1955, J APPL PHYS, V26, P380
WATANABE M, 1977, IEEE T ELECTRON DEV, V24, P1172
WERNER U, 1988, J PHYS D, V21, P116
WITTRY DB, 1965, J APPL PHYS, V36, P1387
WITTRY DB, 1967, J APPL PHYS, V38, P375
WU CJ, 1978, J APPL PHYS, V49, P2827
ZOOK JD, 1983, APPL PHYS LETT, V42, P602
REVIEWED
EPFL