@comment{ generated by <http://infoscience.epfl.ch/> }

@InProceedings{EPFL-CONF-174449,
   abstract    = {The placement of replicas across storage nodes in a
                 replication-based storage system is known to affect
                 rebuild times and therefore system reliability. Earlier
                 work has shown that, for a replication factor of two, the
                 reliability is essentially unaffected by the replica
                 placement scheme because all placement schemes have mean
                 times to data loss (MTTDLs) within a factor of two for
                 practical values of the failure rate, storage capacity,
                 and rebuild bandwidth of a storage node. However, for
                 higher replication factors, simulation results reveal
                 that this no longer holds. Moreover, an analytical
                 derivation of MTTDL becomes intractable for general
                 placement schemes. In this paper, we develop a
                 theoretical model that is applicable for any replication
                 factor and provides a good approximation of the MTTDL for
                 small failure rates. This model characterizes the system
                 behavior by using an analytically tractable measure of
                 reliability: the probability of the shortest path to data
                 loss following the first node failure. It is shown that,
                 for highly reliable systems, this measure approximates
                 well the probability of all paths to data loss after the
                 first node failure and prior to the completion of
                 rebuild, and leads to a rough estimation of the MTTDL.
                 The results obtained are of theoretical and practical
                 importance and are confirmed by means of simulations. As
                 our results show, the declustered placement scheme,
                 contrary to intuition, offers a reliability for
                 replication factors greater than two that does not
                 decrease as the number of nodes in the system increases.},
   affiliation = {EPFL},
   author      = {Venkatasan, Vinodh and Iliadis, Ilias and Fragouli,
                 Christina and Urbanke, Rüdiger},
   booktitle   = {19{t}h {A}nnual {IEEE} {I}nternational {S}ymposium on
                 {M}odelling, {A}nalysis, and {S}imulation of {C}omputer
                 and {T}elecommunication {S}ystems ({MASCOTS} 2011). Best
                 {P}aper {A}ward.},
   details     = {http://infoscience.epfl.ch/record/174449},
   documenturl = {http://infoscience.epfl.ch/record/174449/files/conf8.pdf},
   location    = {Singapore},
   oai-id      = {oai:infoscience.epfl.ch:174449},
   oai-set     = {conf},
   review      = {REVIEWED},
   status      = {PUBLISHED},
   submitter   = {114979; 114979; 114979; 114979},
   title       = {Reliability of clustered vs. {d}eclustered replica
                 placement in data storage systems},
   unit        = {ARNI LTHC},
   year        = 2011
}